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Encounter Test is used in nanometer designs to test for functional device failures and to ensure design specifications are met. Encounter Test Architect adds function to the design to enable better manufacturing test. Encounter True-time Test generates test patterns used in manufacturing test. Encounter Diagnostics help identify the root cause defect of a manufacturing test failure.

Encounter Test Product Review
Dennis Cheney, IBM
Dennis Cheney has used Encounter Test for 2 years to develop high speed microprocessors for use in gaming chips.
IBM
developerWorks. IBM's resource for developersMore »
Rambus
Better performance, faster time to market! Rambus. Your License to Speed.More »
X Initiative
Latest news on adoption and use of the X Architecture.More »
Si2 / OpenAccess
True interoperability among IC design tools.More »
Power.org
Learn about the benefits of Power.org membershipMore »

     
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